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HS Code 90314100 - Instruments for inspecting semiconductors
Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
Can be used for an export declaration.
(Combined Nomenclature, Customs Tariff Number)
Examples (No official information or warranty)
- Optical microscope for inspecting semiconductor wafers (magnification: 100x, working distance: 10mm) with LED illuminator
- Automatic wafer inspection machine using bright field and dark field illumination (inspection capacity: 300mm wafer)
- Optical inspection station with auto-focus and motorized stage for reviewing and analyzing photomasks or reticles (dimension: 600x400x300 mm)
- 3D confocal microscope for inspecting topography and defects on semiconductor devices (scan range: 320x240 μm)
- Digital imaging system for inspecting semiconductor wafers and devices with high-resolution cameras (2x 5 Mpixels CMOS sensors) and software for image analysis
- Multi-mode optical inspection tool for inspecting semiconductor wafers and photomasks or reticles using various illumination modes (bright field, dark field, UV, and IR)
- Fully automated semiconductor inspection system equipped with multiple inspection modes (visual, spectral, and defect Reviews) and data analysis software (database compatibility: MySQL, Oracle)
- Automatic wafer inspection machine using bright field and dark field illumination (inspection capacity: 300mm wafer)
- Optical inspection station with auto-focus and motorized stage for reviewing and analyzing photomasks or reticles (dimension: 600x400x300 mm)
- 3D confocal microscope for inspecting topography and defects on semiconductor devices (scan range: 320x240 μm)
- Digital imaging system for inspecting semiconductor wafers and devices with high-resolution cameras (2x 5 Mpixels CMOS sensors) and software for image analysis
- Multi-mode optical inspection tool for inspecting semiconductor wafers and photomasks or reticles using various illumination modes (bright field, dark field, UV, and IR)
- Fully automated semiconductor inspection system equipped with multiple inspection modes (visual, spectral, and defect Reviews) and data analysis software (database compatibility: MySQL, Oracle)
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9031
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
Other optical instruments and appliances
90314100
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Trade restrictions and policies
Chapter 90
53 Trade restrictions and policies
Position 9031
9 Trade restrictions and policies
Subheading 903141
5 Trade restrictions and policies
Customs Tariff Number 90314100
1996-01-01
ERGA OMNES (1011)
Third country duty
Regulation 2448/95
2017-09-01
North Korea (Democratic People’s Republic of Korea) (KP)
Import control on restricted goods and technologies
Regulation 1509/17
2017-09-01
North Korea (Democratic People’s Republic of Korea) (KP)
Export control on restricted goods and technologies
Regulation 1509/17
2024-11-08
All third countries (1008)
Export authorization (Dual use)
Regulation 2547/24
2024-12-23
Iran, Islamic Republic of (IR)
Export control
Regulation 0267/12
Changes to this tariff number
Changes in favor of 90314100
1995:
90314010
➜
1996:
90314100
1995:
90314020
➜
1996:
90314100